As one of the top manufacturers of scientific instruments, JEOL offers a wide variety of electron optics products for a broad range of applications. JEOL’s main product line and core competency, electron microscopes, have helped advance scientific and industrial research since the 1940s.
JEOL USA Electron Optics Instruments
Today’s generation of electron microscopes deliver extremely high resolution for nanotechnology research and unprecedented quality for imaging fine surface details, analyzing biological and fabricated samples at the atomic level, and seeing microscopic details as they really are, magnified hundreds of thousands of times. Easy to use, flexible for a variety of applications, and backed by JEOL’s award-winning support, JEOL electron microscopes play an influential role in the development of new products and materials, analysis for quality control and forensic investigations, biological research, materials characterization, and more.
JEOL Scanning Electron Microscopes
JEOL has played a leading role in the development and evolution of scanning electron microscopy since the early 1960s. Over the past five decades, the SEM has become an indispensable tool in both advanced research and routine analysis for science and industry. JEOL has installed more than 8000 SEMs worldwide.
SEMs are continually finding new applications in nanotechnology, where nano-fabrication techniques are so advanced that new SEM technology has been developed to help researchers to see the structures they make. More and more failure analysis, pathology, forensic, metallurgical and environmental labs are replacing traditional optical microscopes with SEMs.
As the range of applications for the SEM grows -- and as new discoveries require higher resolutions and greater versatility -- JEOL keeps pace with new technology that enables the SEM user to produce unprecedented images of the microscopic and nanometric world.
Our SEM product line is comprised of four categories differentiated by resolution and configuration:
Conventional Tungsten High Vacuum SEMs: ideal for failure analysis, inspection, and characterization.
Conventional Tungsten Low Vacuum SEMs: for imaging and X-ray analysis of wet, nonconductive, unprepared samples.
Conventional Thermal Field Emission SEMs: field emission source provides higher resolution; high stability and high current in a small spot size and generates high x-ray fluxes for chemical analysis at high resolution conditions.
Semi-in-Lens Cold Cathode Field Emission SEMs: highest resolution SEMs; the cold cathode produces the finest probe size, especially at low accelerating voltages; the semi-in-lens pulls the secondary electrons off the surface by a detector in the objective lens, reducing noise at lower working distances.
JEOL Transmission Electron Microscopes
The Transmission Electron Microscope — TEM — has been used in all areas of biological and biomedical investigations because of its ability to view the finest cell structures. It is also used as a diagnostic tool in hospital pathology labs. For the crystallographer, metallurgist or semiconductor research scientist, current high voltage/high resolution TEMs, utilizing 200 keV to 1 MeV, have permitted the routine imaging of atoms, allowing materials researchers to monitor and design materials with custom-tailored properties. With the addition of energy dispersive X-ray analysis (EDXA) or energy loss spectrometry (EELS), the TEM can also be used as an elemental analysis tool, capable of identifying the elements in areas less than 0.5µm in diameter.
JEOL has produced TEMs since 1949, and currently markets state-of-the-art instruments in the 100 keV to 1 MeV ranges designed to support all TEM applications.
Our TEM product line is comprised of:
- 100 / 120 kV TEM
- 200 kV TEM/FEG TEM
- IVEM 300 kV TEM/FEG TEM
JEOL Scanning Probe Microscopes
The Scanning probe Microscope (SPM) was developed during the 1980s and is now an indispensable tool for the direct high resolution study of surfaces and surface forces. Starting with the scanning tunneling microscope in 1981, the technique was broadened to atomic force microscopy including contact, non-contact, and discrete contact modes by 1988. By changing the force-sensing probe it is possible to detect magnetic forces, electrical forces, frictional forces, surface elasticity, and visco-elasticity, etc. The SPM is currently being used to study samples ranging from semiconductor surfaces and devices, thin films, archeological artifacts, compact discs, computer hard drives, magnetic media, electrical properties of materials, biological materials, to name a few.
Our SPM product line is comprised of the following offerings:
JSPM-4500 Scanning Probe Microscope: designed for the high resolution study of surfaces.
JSPM-5200 Environmental Scanning Probe Microscope: a multipurpose, high resolution SPM offering ease of use with diverse measurement and sample environments.
Surface Analysis Instruments
Our Surface Analysis product line is comprised of three categories: Auger Microanalyzers, Electron Probe Microanalyzers (EPMA), and Photoelectron Spectrometers.
The Auger Microanalyzer utilizes an analytical technique, named after the French scientist P. Auger. It combines auger electron spectroscopy (AES), ion sputtering and secondary electron imaging, and allows for the determination of 2D and 3D elemental distributions on solid surfaces. JEOL Auger Microprobes offer the highest resolution available.
The Electron Probe Microanalyzer (EPMA) utilizes X-ray spectrometry and allows for high speed, high accuracy qualitative and quantitative in-depth surface analysis as well as area analysis.
The Photoelectron Spectrometer systems are capable of qualitative, quantitative, and state analysis of micro-areas for a broad range of samples.
Surface Analysis product line:
JAMP-9500F: Field Emission Auger Microprobe
JXA-8200 SuperProbe: Electron Probe Microanalyzer (EPMA)
JXA-8500F: Electron Probe Microanalyzer (EPMA)
